next >>   WELL2914 :  Thermo Nicolet 6700 Spectrometer Solid Wafer Profiling FT-IR System Thermo-Nicolet 6700 FT-IR Solid Wafer Profiling System is equipped with a KBr beam splitter (7800 – 350 cm-1) and DTGS detector and comes as a set with four(4) different optional measuring accessories that allows a wide variety of solid material measurements. This Ni 6700 solid wafer profiling system is a powerful tool optimized for the characterization research of transmittance and reflectance properties of solid and silicon wafer samples. Fully tested operational, great working condition. #1. Polarizer (Option) for SRA, VAWH Accessory Modules: it fits in SRA or FT-IR sample windows, #2. Wafer Specular Reflectance Analyzer (2 ~ 5 inch, V-N type SRA) with Accessory Inserts, #3. Variable Angle Wafer Analyzer(“VAWH”) for Transmission Measurements: Holder to accommodates round wafers: 8”, 6”, 4” and 2” in dia.; 125 micron to 2 mm thick. Angular Range: 0 - 60º incident angle relative to the normal, #4. Smart SplitPea Micro Sampling ATR. More info. available upon request.  Sale Price: RQ  Copyright (C) 2002-2023, WELLTECH All rights reserved.