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| WELL2878
: Shimadzu SolidSpec 3700 / 3700DUV UV/VIS/NIR Spectrophotometer |
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Shimadzu SolidSpec-3700 UV/VIS/NIR
spectrophotometer is an optimized, high-
performance wafer inspection equipment. It
has equipped with precision measuring
accessories. OPTIONS:
automatic X-Y testing system and an
integrating sphere for precision measuring of
very large sample. Max.700mm × 560mm.
Large Sample Compartment
Three(3) Detectors: PMT, InGaAs, PbS
Integrating sphere (Diffuse & Specular)
(P/N 206-20810-58) Automatic X–Y
Stage (Optional) installed for 6/8/12 inch
Silicon Wafer (or a large solar-film glass).
Sample Sizes: Max. 310mm dia. 310mm X 310mm,
40mm: A powerful tool for high-throughput
measurements. This accessory automatically
measures multiple points.
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