WELL2825: Metrology - PIKE MappIR with N2 Purging Chamber To minimize interferences of water vapor and carbon dioxide with infrared......   WELL2824: Metrology - PIKE MAP300 Automatic Semiconductor Wafer Analyz... This Pike MAP300 is a fully automated accessory for the mapping analysis ......   WELL2823: Metrology - PIKE MappIR Automatic Semiconductor Wafer Analyz... This MappIR is a fully automated accessory for the mapping analysis of wa......   WELL2822: Foss NIRSystems 5000 Direct Contact Analyzer, DCA This FOSS Direct Contact™ Analyzer offers rapid chemical analysis and phy......   WELL2821: Hitachi U-4001 UV-VIS-NIR Spectrophotometer, GPOB + Integrat... This HITACHI U-4001 NIR spectrophotometer has equipped with a 60mm Integr......   WELL2820: Shimadzu UV-3600 NIR, MPC-3100 Multi-Purpose Large Sample Co... Shimadzu UV-3600 UV/Vis/NIR Spectrophotometer that has equipped with a ......   WELL2818: Shimadzu UV-3600 UV-VIS-NIR Spectrophotometer High sensitivity, high resolution, and an ultra-low stray-light level ach......   WELL2817: Hitachi U4150 U4100 8" Wafer Top-Mount Reflectance Measureme... The U-4100 Spectrophotometer (large sample measurement system) is availab......   WELL2816: For sale, used Agilent (Varian) CARY 5000 UV-VIS-NIR Spectro... The latest breakthrough in UV-Vis-NIR: The new generation CARY-5000 sets n......   WELL2815: Agilent (Varian) CARY-5000 UV-VIS-NIR Spectrophotometer w/ D... The new generation CARY-5000 sets new standards for the true research gra......