Description Shimadzu SolidSpec-3700 UV/VIS/NIR Spectrophotometer is an optimized, high-performance wafer inspection equipment. It has equipped with automatic X-Y testing system and an integrating sphere for precision measuring of 6" 8" 12"inch Silicon Wafers or for very large sample. Max.700mm × 560mm. Large Sample Compartment Three(3) Detectors: PMT, InGaAs, PbS Integrating sphere (Diffuse & Specular) (P/N 206-20810-58) Automatic X–Y Stage (Optional) installed for 6/8/12 inch Silicon Wafer (or a large solar-film glass). Sample Sizes: Max. 310mm dia. 310mm X 310mm, 40mm: A powerful tool for high-throughput measurements. This accessory automatically measures multiple points. (P/N 206-20264-91)Direct Detection Unit, DDU (Optional) installed. Measuring Range: 190nm ~3,300nm. (P/N 206-20570- 91) Large Specular Reflectance Attachment, 5°incident angle (Optional) included. Sample Sizes: Max. 470mm x 560mm, 40mm thickness. (P/N 204-58909) Film Holder(Optional) included. Sample Sizes: Min. 16mm W. × 32mm H / Max. 80mm W× 40mm H. System Control Computer & Data Acquisition SW: (Windows-7 O/S, SolidSpec-3700 Control SW), Operating Manuals, etc.