Description This Varian Cary-5000 Research-Grade UV-VIS- NIR Spectrophotometer has equipped with an option of DRA-1800 150-mm Ø InGaAs Integrating Sphere(190 nm ~1,800 nm) for high accuracy transmittance & reflectance measurements of Optics/thin film/lens/AR-filter testing. [ InGaAs VS. PbS Integrating Sphere Comparisons] Enhanced Sensitivity: The signal to noise (S/N) above 860nm in the NIR is significantly different that the InGaAs translates to greater sensitivity allowing the analysis of smaller samples. Greater sensitivity can be traded for analysis speed. High Absorbance Measurement for Dark Sample Analysis: The InGaAs sphere allows the superior linearity and that is not possible on the PbS sphere. [ Variable Angle Specular Reflectance Accessory (VASRA) ] The Cary VASRA provides the ability to automatically measure the specular reflectance of a sample surface at angles of incidence ranging from 20 to 70 degrees. The VASRA is ideal for measuring the reflectance of materials at various angles and wavelengths(190 nm ~3,100 nm), characterizing mirrors and determining the refractive index and thickness of thin films. The characterization of thin films for optical components is important in semiconductor, micro-machining, defense, materials and other high technology applications.