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Description
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Shimadzu MPC-3100 Multi-Purpose Large Sample Compartment
with its built-in integrating sphere enables the non-
destructive transmission/reflectance measurements of very
large samples or various-shaped samples - optical and
electronic materials, including thin film, lens, large-
sized glass, silicon wafers, optical parts, new materials,
liquid crystal substrates and solar cells, etc. You can
build a system that is well-suited for a particular
measurement purpose by combining this MPC-3100 system
with a variety of sample accessories, such as Absolute
Specular Reflection Attachment (ASR).
ASR-3105, INCEDENT ANGLE 5ﾟ CAT: 206-16817
ASR-3112, INCEDENT ANGLE 12°CAT: 206-16100
ASR-3130, INCEDENT ANGLE 30°CAT: 206-15001
ASR-3145, INCEDENT ANGLE 45°CAT: 206-15002
MPC-3100 offers enormous flexibility for the
evaluation and quality control of a wide variety of
optical components over a measurement wavelength range of
240 to 2600 nm. For UV-3600 and UV-3101 UV-VIS-NIR
Spectrophotometers - High performance measurements for the
most demanding samples.
Maximum Sample Size:
Transmission:305 mm dia.X 50mm T or 204 mm dia.X 300
mm T Reflection:305 mm dia.X 50 mm T
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