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WELL2879
: HITACHI U-4100 Uv-Vis-Nir 8'' Wafer Testing System, METROLOGY |
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The U-4100 Spectrophotometer (large sample
measurement system) is available for non-
destructive transmittance/reflectance
measurement of various optical and electronic
materials including large-sized glass,
silicon wafer and liquid crystal board. Wafer
Reflectance/Transmittance Measurement System.
“Top-mount transmittance/reflectance
measurement unit (relative) for U-4100 (P/N
134-0107)”. This accessory permits
measurement of the relative reflectance to
the reference sample at an incident angle of
5° and measurement of the transmittance at an
incident angle of 0°(the absolute reflectance
cannot be measured with this accessory). The
accessory also permits reflectance
/transmittance measurement at a desired angle
on a sample with the moving/rotating stage.
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