<< previous  next >>   WELL2793 :  Shimadzu UV 3101PC UV-VIS-NIR, Absolute Specular Reflectance Attachments Shimadzu UV-3101PC UV-VIS-NIR Equipped with a MPC-3100 Multi-Purpose Large Sample Compartment affords the non-destructive transmittance/reflectance measurement of various optical and electronic materials, including thin film, lens, large-sized glass, silicon wafers, optical parts, new materials, liquid crystal substrates and solar cells, beyond the measurement of solar cell components. This system is designed for transmittance/reflectance measurement of solid samples. You can build a system that is well-suited for a particular measurement purpose by combining the system with a variety of accessories, such as absolute specular reflection attachment in incedent Angles of 5°, 15°, 30°, 45°. More information available upon request.  Sale Price: RQ  Copyright (C) 2002-2023, WELLTECH All rights reserved.