<< previous  next >>   WELL2817 :  Hitachi U4150 U4100 8" Wafer Top-Mount Reflectance Measurement System, METROLOGY The U-4100 Spectrophotometer (large sample measurement system) is available for non- destructive transmittance/reflectance measurement of various optical and electronic materials including large-sized glass, silicon wafer and liquid crystal board. Wafer Reflectance/Transmittance Measurement System. “Top-mount transmittance/reflectance measurement unit (relative) for U-4100 (P/N 134-0107)”. This accessory permits measurement of the relative reflectance to the reference sample at an incident angle of 5° and measurement of the transmittance at an incident angle of 0°(the absolute reflectance cannot be measured with this accessory). The accessory also permits reflectance/transmittance measurement at a desired angle on a sample with the moving/rotating stage.  Sale Price: RQ  Copyright (C) 2002-2023, WELLTECH All rights reserved.